Assignment of Assignors Interest.

Recorded: 1991-12-13 Pages: 2

Assignor

ISOBE, TAMI

Executed: 1989-12-28

Assignee

RICOH COMPANY, LTD.

3-6, 1-CHOME NAKAMAGOME, OTA-KU, TOKYO, JAPAN

Covered Property (1)

Method for Measuring Refractive Index of Thin Film Layer

Patent: 5,096,298 →

Application: 07/453,902 →

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.