IP Library Assignment 006405/0218
Patent Assignment
Reel/Frame 006405/0218

Assignment of Assignors Interest.

Recorded: 1992-12-30 Pages: 2
Assignor
OZAKI, HIDEHARU
Executed: 1992-10-28
Assignee
NEC CORPORATION
7-1, SHIBA 5-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Semiconductor Integrated Logic Circuit with Internal Circuit to Be Examined by Scan Path Test Method
Patent: 5,425,034 →
Application: 07/967,727 →
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Feb 25, 2003
From: NEC CORPORATION
To: NEC ELECTRONICS CORPORATION
Reel/Frame 013758/0440 →
Change of Name Oct 15, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025148/0010 →