Assignment of Assignors Interest.

Recorded: 1993-03-23 Pages: 2

Assignor

NIZAKA, MINORU

Executed: 1993-03-05

Assignee

NEC CORPORATION

7-1, SHIBA 5-CHOME, MINATO-KU, TOKYO, JAPAN

Covered Property (1)

Non-Volatile Memory Device Having Built-in Test Pattern Generator Used in a Diagnostic Operation on Control Signal Lines for Data Propagation Path

Patent: 5,682,389 →

Application: 08/035,794 →

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.