IP Library › Assignment 010037/0008
Patent Assignment
Reel/Frame 010037/0008

Assignment of Assignor's Interest

Recorded: 1999-06-08 Pages: 3
Assignors
EGASHIRA, KYOKO
Executed: 1999-06-04
ERIGUCHI, KOJI
Executed: 1999-06-04
Assignee
MATSUSHITA ELETRONICS CORPORATION
1-1, SAIWAI-CHO, TAKATSUKI-SHI, OSAKA 569-1193, JAPAN
Covered Property (1)
Method for Examining Semiconductor Substrate,and Method for Controlling Fabrication Process of Semiconductor Devices
Patent: 6,469,535 →
Application: 09/327,467 →
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jun 7, 2001
From: MATSUSHITA ELECTRONICS CORPORATION
To: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Reel/Frame 011855/0674 →