Assignment of Assignor's Interest

Recorded: 2001-01-23 Pages: 2

Assignor

KACZYNSKI, ULRICH

Executed: 2001-01-02

Assignee

LEICA MICROSYSTEMS WETZLAR GMBH

ERNST-LEITZ-STRASSE 17-37, D-35578 WETZLAR, GERMANY

Covered Property (1)

Measuring Instrument and Method for Measuring Patterns on Substrates of Various Thicknesses

Patent: 6,441,911 →

Application: 09/685,086 →

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.