Patent Assignment
Reel/Frame 011492/0548
Assignment of Assignor's Interest
Recorded: 2001-01-16
Received: 2001-02-09
Pages: 2
Assignee
MITSUBISHI DENKI KABUSHIKI KAISHA
2-3, MARUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO 100-8310, JPX, JAPAN
Covered Property
(1)
Semiconductor memory device enabling test of timing standard for strobe signal and data signal with ease, and subsidiary device and testing device thereof
Application:
09/759,358 →