Patent Assignment
Reel/Frame 011713/0461
Assignment of Assignor's Interest
Recorded: 2001-04-11
Received: 2001-04-26
Pages: 2
Assignor
AIHARA, TOMOAKI
Executed: 2001-04-05
Assignee
NEC CORPORATION
CORPORATION OF JAPAN, 7-1, SHIBA 5-CHOME, MINATO-KU, TOKYO, JPX, JAPAN
Covered Property
(1)
Method and Apparatus for Inspecting Semiconductor Device
Application:
09/832,666 →