Patent Assignment
Reel/Frame 011716/0431
Assignment of Assignor's Interest
Recorded: 2001-04-16
Received: 2001-04-27
Pages: 5
Assignors
JUNNAPART, JITRAYUT
Executed: 2001-03-23
NAKSRIKRAM, JANEVOOT
Executed: 2001-03-23
SURAPHAK, AEKSIT
Executed: 2001-04-11
Assignee
ADVANCED MICRO DEVICES, INC.
P.O. BOX 3453, CALIFORNIA, CA, 94088, UNITED STATES
Covered Property
(1)
System and Method for Erase Test of Integrated Circuit Device Having Non-Homogeneously Sized Sectors
Application:
09/836,065 →