IP Library Assignment 011876/0939
Patent Assignment
Reel/Frame 011876/0939

Assignment of Assignor's Interest

Recorded: 2001-06-08 Received: 2001-06-13 Pages: 3
Assignors
KAKIZAWA, AKIRA
Executed: 2001-05-04
FOUGHT, ERIK T.
Executed: 2001-05-14
Assignee
INTEL CORPORATION
2200 MISSION COLLEGE BOULEVARD, SANTA CLARA, CA, 95052, UNITED STATES
Covered Property (1)
Method and Apparatus for Failure Detection Utilizing Functional Test Vectors and Scan Mode
Application: 09/757,320 →