Patent Assignment
Reel/Frame 011876/0939
Assignment of Assignor's Interest
Recorded: 2001-06-08
Received: 2001-06-13
Pages: 3
Assignee
INTEL CORPORATION
2200 MISSION COLLEGE BOULEVARD, SANTA CLARA, CA, 95052, UNITED STATES
Covered Property
(1)
Method and Apparatus for Failure Detection Utilizing Functional Test Vectors and Scan Mode
Application:
09/757,320 →