Patent Assignment
Reel/Frame 012006/0524
Assignment of Assignor's Interest
Recorded: 2001-07-20
Pages: 2
Assignor
SATO, MASAYUKI
Executed: 2001-07-12
Assignee
HITACHI, LTD.
CHIYODA-KU,, 6, KANDA SURUGADAI 4-CHOME, TOKYO,, JAPAN
Covered Property
(1)
Tester Architecture Construction Data Generating Method, Tester Architecture Constructing Method and Test Circuit
Related Assignments
(3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Oct 1, 2003
From: HITACHI, LTD.
To: RENESAS TECHNOLOGY CORPORATION
Reel/Frame 014573/0096 →
Assignment of Assignor's Interest
Nov 28, 2006
From: HITACHI, LTD.
To: RENESAS TECHNOLOGY CORPORATION
Reel/Frame 018559/0281 →
Merger
Jul 7, 2010
From: RENESAS TECHNOLOGY CORP.
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024662/0280 →