Patent Assignment
Reel/Frame 012067/0765
Assignment of Assignor's Interest
Recorded: 2001-08-13
Received: 2001-08-17
Pages: 2
Assignors
MORI, HISAYA
Executed: 2001-06-12
YAMADA, SHINJI
Executed: 2001-06-13
FUNAKURA, TERUHIKO
Executed: 2001-06-14
Assignees
MITSUBISHI DENKI KABUSHIKI KAISHA
2-3, MARUNOUCHI 2-CHOME CHIYODA-KU, TOKYO 100-8310, JPX, JAPAN
RYODEN SEMICONDUCTOR SYSTEM ENGINEERING CORPORATION
1 MIZUHARA 1-CHOME ITAMI-SHI, HYOGO 664-0005, JPX, JAPAN
Covered Property
(1)
External Test Auxiliary Device to Be Used for Testing Semiconductor Device
Application:
09/927,366 →