Patent Assignment
Reel/Frame 012256/0996
Assignment of Assignor's Interest
Recorded: 2001-10-10
Received: 2001-10-22
Pages: 2
Assignor
MIKI, KAZUNOBU
Executed: 2001-09-14
Assignee
MITSUBISHI DENKI KABUSHIKI KAISHA
2-3, MATUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO 100-8310, JPX, JAPAN
Covered Property
(1)
Semiconductor Element Test Apparatus, and Method of Testing Semiconductor Element Using the Apparatus
Application:
09/973,049 →