Assignment of Assignor's Interest

Recorded: 2002-02-26 Received: 2002-03-14 Pages: 2

Assignor

KISHIMOTO, KAZUNORI

Executed: 2002-02-19

Assignee

NEC CORPORATION

MINATO-KU, 7-1, SHIBA 5-CHOME, TOKYO, JPX, JAPAN

Covered Property (1)

Method of Testing a Semiconductor Integrated Circuit and Method and Apparatus for Generating Test Patterns

Application: 10/083,447 →