Patent Assignment
Reel/Frame 012827/0746
Assignment of Assignor's Interest
Recorded: 2002-04-18
Received: 2002-04-29
Pages: 3
Assignee
IC MEMS, INC.
INTER-UNIVERSITY SEMICONDUCTOR RESEARCH CENTER (MAIN BUILDING), SEOUL NATIONAL UNIVERSITY, SAN 56-1, SHINLIM-DONG, GWANAK-GU, SEOUL 151-742, KRX, KOREA, REPUBLIC OF
Covered Property
(1)
Probe Structure for Testing Semiconductor Devices and Method for Fabricating the Same
Application:
10/125,248 →