Patent Assignment
Reel/Frame 012872/0061
Assignment of Assignor's Interest
Recorded: 2002-05-03
Received: 2002-05-13
Pages: 2
Assignors
KASHIHARA, YOJI
Executed: 2002-04-18
OHBAYASHI, SHIGEKI
Executed: 2002-04-18
UKITA, MOTOMU
Executed: 2002-04-18
Assignee
MITSUBISHI DENKI KABUSHIKI KAISHA
2-3, MARUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO 100-8310, JPX, JAPAN
Covered Property
(1)
Semiconductor Memory Device and Testing Method Therefor
Application:
10/137,352 →