IP Library › Assignment 012903/0270
Patent Assignment
Reel/Frame 012903/0270

ASSIGNMENT OF ASSIGNOR'S INTEREST

Recorded: 2002-05-15 Received: 2002-05-22 Pages: 2
Assignors
FUNAKURA, TERUHIKO
Executed: 2002-04-24
HANAI, HISAYOSHI
Executed: 2002-04-24
MORI, HISAYA
Executed: 2002-04-24
YAMADA, SHINJI
Executed: 2002-04-30
Assignees
MITSUBISHI DENKI KABUSHIKI KAISHA
CHIYODA-KU, 2-3, MARUNOUCHI 2-CHOME, TOKYO 100-8310, JPX, JAPAN
RYODEN SEMICONDUCTOR SYSTEM ENGINEERING CORPORATION
ITAMI-SHI, 1 MIZUHARA 4-CHOME, HYOGO 664-0005, JPX, JAPAN
Covered Applications (3)
TESTER FOR SEMICONDUCTOR INTEGRATED CIRCUITS
App. No. 10/145,192
→
PHYSICAL LINEARITY TEST FOR INTEGRATED CIRCUIT DELAY LINES
App. No. 10/141,998
→
DIRECT METHANOL FUEL CELL AND SYSTEM
App. No. 10/140,612
→