Patent Assignment
Reel/Frame 013132/0895
Assignment of Assignor's Interest
Recorded: 2002-07-24
Received: 2002-08-02
Pages: 2
Assignors
AKIYAMA, MIHOKO
Executed: 2002-07-12
FUJII, NOBUYUKI
Executed: 2002-07-12
MORISHITA, FUKASHI
Executed: 2002-07-12
OKAMOTO, MAKO
Executed: 2002-07-12
TAITO, YASUHIKO
Executed: 2002-07-12
YAMAZAKI, AKIRA
Executed: 2002-07-12
Assignees
MITSUBISHI DENKI KABUSHIKI KAISHA
2-3, MARUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO 100-8310, JPX, JAPAN
MITSUBISHI ELECTRIC ENGINEERING COMPANY LIMITED
2-6-2, OHTEMACHI, CHIYODA-KU, TOKYO 100-0004, JPX, JAPAN
Covered Property
(1)
Semiconductor Integrated Circuit with Voltage Down Converter Adaptable for Burn-in Testing
Application:
10/201,080 →