Patent Assignment
Reel/Frame 013217/0662
Assignment of Assignor's Interest
Recorded: 2002-08-19
Received: 2002-08-28
Pages: 5
Assignors
WANG, ZHIGANG
Executed: 2002-03-27
YANG, NIAN
Executed: 2002-03-27
YANG, TIEN-CHUN
Executed: 2002-03-29
Assignee
ADVANCED MICRO DEVICES, INC.
ONE AMD PLACE, M/S 68, P.O. BOX 3453, SUNNYVALE, CA, 94088-3453, UNITED STATES
Covered Properties
(2)
Method of Determining the Active Region Width Between Shallow Trench Isolation Structures Using a C-V Measurement Technique for Fabricating a Flash Memory Semiconductor Device and a Device Thereby Formed
Application:
10/224,028 →
Failure Diagnostic System of Evaporated Fuel Processing System
Application:
10/153,637 →