Patent Assignment
Reel/Frame 013218/0527
Assignment of Assignor's Interest
Recorded: 2002-08-22
Received: 2002-08-28
Pages: 2
Assignor
YAGI, KENYA
Executed: 2002-07-19
Assignee
MITSUBISHI DENKI KABUSHIKI KAISHA
2-3, MARUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO 100-8310, JPX, JAPAN
Covered Property
(1)
Semiconductor Inspection Device Capable of Performing Various Inspections on a Semiconductor Device
Application:
10/225,124 →