Patent Assignment
Reel/Frame 013343/0351
Merger
Recorded: 2003-01-09
Received: 2003-01-09
Pages: 6
Assignor
VANTIS CORPORATION
Executed: 2002-02-11
Assignee
LATTICE SEMICONDUCTOR CORPORATION
5555 NE MOORE COURT, HILLSBORO, OR, 97124, UNITED STATES
Covered Properties
(5)
Variable Grain Architecture for Fpga Integrated Circuits
Application:
10/090,209 →
Diagnostic Sanitary Test Strip
Application:
09/984,948 →
Method of Strip Insertion Detection
Application:
09/794,037 →
Distinguishing Test Types Through Spectral Analysis
Application:
09/794,044 →
Method for Determining Concentration of an Analyte in a Test Strip
Application:
09/794,045 →