Assignment of Assignor's Interest

Recorded: 2002-11-19 Received: 2002-11-25 Pages: 2

Assignors

HARTMANN, HENNING

Executed: 2001-07-12

HOTTGENROTH, DIRK

Executed: 2001-07-12

Assignee

INFINEON TECHNOLOGIES AG

RIDLERSTRASSE 55, PATENTABTEILUNG, MUENCHEN, DEX, 80339, GERMANY

Covered Properties (2)

Structural Design and Processes to Control Probe Position Accuracy in a Wafer Test Probe Assembly

Application: 10/145,661 →

Method and Circuit Configuration for Controlling a Data Driver

Application: 09/998,723 →