IP Library Assignment 013595/0431
Patent Assignment
Reel/Frame 013595/0431

Assignment of Assignor's Interest

Recorded: 2002-12-11 Received: 2002-12-24 Pages: 2
Assignor
Assignee
FEI COMPANY
7451 NW EVERGREEN PARKWAY, HILLSBORO, OR, 97124-5830, UNITED STATES
Covered Properties (4)
Method of X-Ray Analysis in a Particle-Optical Apparatus
Application: 10/123,666 →
Sem Provided with a Secondary Electron Detector Having a Central Electrode
Application: 10/024,777 →
Particle-Optical Inspection Device Especially for Semiconductor Wafers
Application: 10/024,762 →
SEM provided with an adjustable final electrode in the electrostatic objective
Application: 10/043,389 →