Patent Assignment
Reel/Frame 013595/0431
Assignment of Assignor's Interest
Recorded: 2002-12-11
Received: 2002-12-24
Pages: 2
Assignor
PHILIPS ELECTRONICS NORTH AMERICA CORPORATION
Executed: 2002-11-19
Assignee
FEI COMPANY
7451 NW EVERGREEN PARKWAY, HILLSBORO, OR, 97124-5830, UNITED STATES
Covered Properties
(4)
Method of X-Ray Analysis in a Particle-Optical Apparatus
Application:
10/123,666 →
Sem Provided with a Secondary Electron Detector Having a Central Electrode
Application:
10/024,777 →
Particle-Optical Inspection Device Especially for Semiconductor Wafers
Application:
10/024,762 →
SEM provided with an adjustable final electrode in the electrostatic objective
Application:
10/043,389 →