Patent Assignment
Reel/Frame 013689/0171
Assignment of Assignor's Interest
Recorded: 2003-01-23
Received: 2003-01-28
Pages: 3
Assignors
BOURGEOIS, PIERRE-DAVID
Executed: 2003-01-02
LECHOT, ANDRE
Executed: 2003-01-02
MAHMOUD, EZZEDINE
Executed: 2003-01-02
WHITE, PATRICK MICHEL
Executed: 2003-01-02
Assignee
PRECIMED S.A.
L'ECHELETTE 7, ORVIN, CHX, 2534, SWITZERLAND
Covered Properties
(2)
Wafer Probing Test Apparatus and Method of Docking the Test Head and Probe Card Thereof
Application:
10/347,240 →
Torque-Transmitting Coupling
Application:
10/059,232 →