Patent Assignment
Reel/Frame 013717/0650
Assignment of Assignor's Interest
Recorded: 2003-01-28
Received: 2003-01-31
Pages: 3
Assignor
NEC CORPORATION
Executed: 2003-01-10
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA 211-8668, JPX, JAPAN
Covered Properties
(3)
Memory Testing Apparatus and Method
Application:
09/844,357 →
Method of Dram
Application:
09/842,944 →
Method and Apparatus for Inspecting Semiconductor Device
Application:
09/832,666 →