IP Library Assignment 013729/0047
Patent Assignment
Reel/Frame 013729/0047

Assignment of Assignor's Interest

Recorded: 2003-02-03 Pages: 3
Assignors
YAMAMOTO, SEIJI
Executed: 2002-11-21
KOUMYOJI, HIROSUKE
Executed: 2002-11-21
YASUDA, TOHRU
Executed: 2002-11-27
ISHIKAWA, MIKIO
Executed: 2002-11-25
SOBUE, ISAYA
Executed: 2002-11-21
SATO, HAJIME
Executed: 2002-11-21
FURUKAWA, CHIAKI
Executed: 2002-11-21
SUGIURA, AKIRA
Executed: 2002-11-21
IWASE, AKIHIRO
Executed: 2002-11-21
Assignee
FUJITSU LIMITED
1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA 211-8588, JAPAN
Covered Property (1)
Semiconductor Device and Test Method for the Same
Patent: 6,885,212 →
Application: 10/356,489 →
Publication: US 2003/0234661
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Dec 12, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021998/0645 →
Change of Name Jul 22, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024982/0245 →
Assignment of Assignor's Interest Apr 27, 2015
From: FUJITSU SEMICONDUCTOR LIMITED
To: SOCIONEXT INC.
Reel/Frame 035508/0337 →