IP Library › Assignment 013747/0987
Patent Assignment
Reel/Frame 013747/0987

Corrected Recordation Form Cover Sheet to Correct the Assignee's Address, Previously Recorded at Reel/Frame 013334/0920 (Assignment of Assignor's Interest)

Recorded: 2002-09-27 Pages: 2
Assignors
TSUBOI, HIROYOSHI
Executed: 2002-07-12
FUJIOKA, SHINYA
Executed: 2002-07-12
Assignee
FUJITSU LIMITED
1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA 211-8588, JAPAN
Covered Property (1)
Semiconductor Integrated Circuit and Method for Testing the Same
Patent: 6,971,052 →
Application: 10/255,671 →
Publication: US 2003/0102885
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 27, 2002
From: TSUBOI, HIROYOSHI; FUJIOKA, SHINYA
To: FUJITSU LIMITED
Reel/Frame 013334/0920 →
Assignment of Assignor's Interest Dec 12, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021998/0645 →
Change of Name Jul 22, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024982/0245 →
Assignment of Assignor's Interest Apr 27, 2015
From: FUJITSU SEMICONDUCTOR LIMITED
To: SOCIONEXT INC.
Reel/Frame 035507/0923 →