Patent Assignment
Reel/Frame 013759/0710
Assignment of Assignor's Interest
Recorded: 2003-02-10
Received: 2003-02-21
Pages: 2
Assignors
KANETANI, KAZUO
Executed: 2001-12-03
NAMBU, HIROAKI
Executed: 2001-12-03
ARAKAWA, FUMIHIKO
Executed: 2001-12-04
HIGETA, KEIICHI
Executed: 2001-12-04
KUSUNOKI, TAKESHI
Executed: 2001-12-04
YAMASAKI, KANAME
Executed: 2001-12-06
Assignees
HITACHI, LTD.
6, KANDA SURUGADAI 4-CHOME, CHIYODA-KU, TOKYO, JPX, JAPAN
HITACHI DEVICE ENGINEERING CO., LTD.
3681, HAYANO, MOBARA-SHI, CHIBA-KEN, 2978581, JPX, JAPAN
Covered Properties
(3)
Method of Testing a Semiconductor Integrated Device
Application:
10/360,867 →
Entry Relocation in a Content Addressable Memory Device
Application:
10/300,652 →
Surge Brake Actuator
Application:
10/264,291 →