Patent Assignment
Reel/Frame 013778/0476
Assignment of Assignor's Interest
Recorded: 2003-07-07
Pages: 4
Assignee
SUN MICROSYSTEMS, INC.
4150 NETWORK CIRCLE, SANTA CLARA, CALIFORNIA, 95054
Covered Property
(1)
Method and Apparatus for Generating Test Pattern for Integrated Circuit Design
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.