Patent Assignment
Reel/Frame 013790/0474
Assignment of Assignor's Interest
Recorded: 2003-02-26
Pages: 8
Assignor
NEC CORPORATION
Executed: 2002-11-01
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property
(1)
Method for measuring coma aberration in optical system
Application:
09/981,912 →
Publication:
US 2002/0048018
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.