IP Library Assignment 013927/0759
Patent Assignment
Reel/Frame 013927/0759

Assignment of Assignor's Interest

Recorded: 2003-03-31 Pages: 2
Assignors
KOIKE, KESAHIRO
Executed: 2003-03-27
OHTSUKA, MASATO
Executed: 2003-03-27
TOCHIHARA, YASUTAKA
Executed: 2003-03-27
Assignee
HOYA CORPORATION
7-5, NAKA-OCHIAI 2-CHOME, SHINJUKU-KU, TOKYO, JAPAN
Covered Property (1)
Method of Determining a Flatness of an Electronic Device Substrate, Method of Producing the Substrate, Method of Producing a Mask Blank, Method of Producing a Transfer Mask, Polishing Method, Electronic Device Substrate, Mask Blank, Transfer Mask, and Polishing App
Patent: 6,951,502 →
Application: 10/401,770 →
Publication: US 2003/0186624