Patent Assignment
Reel/Frame 014213/0563
Assignment of Assignor's Interest
Recorded: 2003-04-24
Pages: 2
Assignor
SEITOH, AKIRA
Executed: 2003-03-20
Assignee
HITACHI, LTD.
6, KANDA SURUGADAI 4-CHOME, CHIYODA-KU TOKYO, JAPAN
Covered Property
(1)
Semiconductor Memory, Method of Testing Semiconductor Memory, and Method of Manufacturing Semiconductor Memory
Patent:
6,829,181 →
Application:
10/399,975 →
Related Assignments
(3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Dec 11, 2003
From: HITACHI, LTD.
To: RENESAS TECHNOLOGY CORPORATION
Reel/Frame 014244/0278 →
Change of Name
Aug 13, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024864/0635 →
Merger
Aug 13, 2010
From: RENESAS TECHNOLOGY CORP.
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024879/0190 →