Patent Assignment
Reel/Frame 014268/0354
Assignment of 50% of Us Pat. No. 6628069
Recorded: 2004-01-20
Received: 2004-01-20
Pages: 2
Assignor
CHI MEI OPTOELECTRONICS CORP.
Executed: 2003-12-26
Assignee
KYOCERA CORPORATION
6 TAKEDA TOBADONO-CHO, FUSHIMI-KU, KYOTO 612-8501, JPX, JAPAN
Covered Properties
(4)
Method and Apparatus for Socket Calibration of Integrated Circuit Testers
Application:
10/106,280 →
Test System Formatters Configurable for Multiple Data Rates
Application:
10/101,564 →
Comparator Circuit for Differential Swing Comparison and Common-Mode Voltage Comparison
Application:
10/057,134 →
Organic Electroluminescent Element
Application:
09/815,641 →