See Recording at Reel 014426 Frame 0467. (Document

Recorded: 2003-07-16 Received: 2003-07-23 Pages: 3

Assignor

IKETANI, MASAYUKI

Executed: 2003-06-13

Assignee

RENESAS TECHNOLOGY CORP.

4-1, MARUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO 100-6334, JPX, JAPAN

Covered Property (1)

Semiconductor Integrated Circuit Device Capable of Shortening Period Required for Performing Data Retention Test

Application: 10/619,476 →