IP Library Assignment 014369/0668
Patent Assignment
Reel/Frame 014369/0668

Assignment of Assignor's Interest

Recorded: 2003-08-04 Pages: 3
Assignors
KOBAYASHI, SOICHI
Executed: 2003-07-11
YAMAZAKI, YOSHIAKI
Executed: 2003-07-11
SHIMAZU, YUKIHIKO
Executed: 2003-07-11
Assignee
RENESAS TECHNOLOGY CORP.
4-1, MARUNOUCHI 2-CHOME CHIYODA-KU, TOKYO 100-6334, JAPAN
Covered Property (1)
Semiconductor Integrated Circuit Capable of Testing with Small Scale Circuit Configuration
Patent: 7,457,996 →
Application: 10/632,928 →
Publication: US 2004/0184328
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 15, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024990/0059 →
Merger Sep 15, 2010
From: RENESAS TECHNOLOGY CORP.
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024990/0098 →