Patent Assignment
Reel/Frame 014445/0827
Assignment of Assignor's Interest
Recorded: 2003-08-28
Pages: 3
Assignor
NAKAJIMA, KAZUHIRO
Executed: 2003-08-27
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, 211-8668, JAPAN
Covered Property
(1)
Test Method and Apparatus for Verifying Fabrication of Transistors in an Integrated Circuit
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.