Patent Assignment
Reel/Frame 014545/0033
Assignment of Assignor's Interest
Recorded: 2003-10-01
Received: 2003-10-06
Pages: 3
Assignor
HITACHI, LTD
Executed: 2003-09-12
Assignee
RENESAS TECHNOLOGY CORPORATION
4-1, MARUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO, JPX, JAPAN
Covered Properties
(3)
Method of Testing a Semiconductor Integrated Device
Application:
10/360,867 →
Semiconductor Memory Circuit
Application:
10/190,480 →
Semiconductor Memory Device
Application:
10/175,301 →