Patent Assignment
Reel/Frame 014772/0341
Assignment of Assignor's Interest
Recorded: 2003-12-09
Pages: 3
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property
(1)
Probe Testing Method and Apparatus for Determining Acceptable/Defective End Shape of Contact Probe Through Image Analysis
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.