Patent Assignment
Reel/Frame 014874/0884
Assignment of Assignor's Interest
Recorded: 2004-01-07
Pages: 3
Assignee
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
1006, OAZA KADOMA, KADOMA-SHI, OSAKA 571-8501, JAPAN
Covered Property
(1)
Method for Measuring Silicide Proportion, Method for Measuring Annealing Temperature, Method for Fabricating Semiconductor Device and X-Ray Photo Receiver
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.