IP Library › Assignment 014928/0935
Patent Assignment
Reel/Frame 014928/0935

Assignment of Assignor's Interest

Recorded: 2004-01-26 Pages: 2
Assignor
SAITO, SYUICHI
Executed: 2003-12-19
Assignee
FUJITSU LIMITED
1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA 211-8588, JAPAN
Covered Property (1)
Semiconductor Testing Circuit, Semiconductor Storage Device, and Semiconductor Testing Method
Patent: 7,228,470 →
Application: 10/763,334 →
Publication: US 2004/0177296
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Dec 12, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021998/0645 →
Change of Name Jul 22, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024982/0245 →
Assignment of Assignor's Interest Apr 27, 2015
From: FUJITSU SEMICONDUCTOR LIMITED
To: SOCIONEXT INC.
Reel/Frame 035508/0337 →