Patent Assignment
Reel/Frame 015028/0554
Assignment of Assignor's Interest
Recorded: 2004-02-25
Received: 2004-03-05
Pages: 3
Assignors
CHEN, HUI-MEI
Executed: 2003-11-01
CHOU, CHIEN-KANG
Executed: 2003-11-01
LEE, JIN-YUAN
Executed: 2003-11-01
LIU, HSIEN-TSUNG
Executed: 2003-11-01
Assignee
MEGIC CORPORATION
21 R&D FIRST ROAD, SCIENCE-BASED INDUSTRIAL PARK, HSIN-CHU, TWX, R.O.C., TAIWAN
Covered Property
(1)
Method for improving semiconductor wafer test accuracy
Application:
10/786,807 →