IP Library › Assignment 015037/0466
Patent Assignment
Reel/Frame 015037/0466

Assignment of Assignor's Interest

Recorded: 2004-03-03 Pages: 2
Assignor
Assignee
KABUSHIKI KAISHA TOSHIBA
1-1 SHIBAURA 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Systems and Methods for Circuit Testing
Patent: 7,055,077 →
Application: 10/744,917 →
Publication: US 2005/0138509
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Dec 23, 2003
From: KIRYU, NOAKI; BUSHARD, LOUIS B.
To: INTERNATIONAL BUSINESS MACHINES CORP.; TOSHIBA AMERICA ELECTRONIC COMPONENTS, INC.
Reel/Frame 014857/0930 →
Assignment of Assignor's Interest Feb 22, 2018
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
Reel/Frame 045007/0891 →