IP Library › Assignment 015133/0886
Patent Assignment
Reel/Frame 015133/0886

Assignment of Assignor's Interest

Recorded: 2004-03-25 Pages: 3
Assignor
ABE, TSUNEO
Executed: 2004-01-15
Assignee
ELPIDA MEMORY, INC.
2-1, YAESU 2-CHOME, CHUO-KU, TOKYO, JAPAN
Covered Property (1)
Semiconductor Device Having a Test Circuit for Testing an Output Circuit
Patent: 6,999,889 →
Application: 10/758,527 →
Publication: US 2004/0148123
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Security Agreement Jul 29, 2013
From: PS4 LUXCO S.A.R.L.
To: ELPIDA MEMORY INC.
Reel/Frame 032414/0261 →
Assignment of Assignor's Interest May 15, 2014
From: ELPIDA MEMORY, INC.
To: PS4 LUXCO S.A.R.L.
Reel/Frame 032894/0588 →
Change of Name Aug 24, 2016
From: PS5 LUXCO S.A.R.L.
To: LONGITUDE SEMICONDUCTOR S.A.R.L.
Reel/Frame 039793/0880 →
Assignment of Assignor's Interest Aug 24, 2016
From: PS4 LUXCO S.A.R.L.
To: PS5 LUXCO S.A.R.L.
Reel/Frame 039818/0506 →