Patent Assignment
Reel/Frame 015135/0170
Assignment of Assignor's Interest
Recorded: 2004-02-26
Pages: 2
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE NAKAHARA-KU, KAWASAKI, KANAGAWA, JAPAN
Covered Property
(1)
Semiconductor Integrated Circuit Device with Boundary Scan Test and Design Automation Apparatus, Boundary Scan Test Method and Program
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.