Patent Assignment
Reel/Frame 015175/0269
Assignment of Assignor's Interest
Recorded: 2004-03-31
Pages: 2
Assignor
TOUNAI, KEIICHIRO
Executed: 2004-03-24
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA, JAPAN
Covered Property
(1)
Method and Program for Correcting and Testing Mask Pattern for Optical Proximity Effect
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.