IP Library Assignment 015211/0027
Patent Assignment
Reel/Frame 015211/0027

Assignment of Assignor's Interest

Recorded: 2004-04-05 Pages: 4
Assignors
LEE, CHANG HA
Executed: 2004-03-13
KIM, TAEK CHEON
Executed: 2004-03-13
KIM, SUK JOON
Executed: 2004-03-13
KIM, GA HYUN
Executed: 2004-03-13
JUNG, JI HWA
Executed: 2004-03-15
Assignee
SAMSUNG CORNING PRECISION GLASS CO., LTD.
644-1 JINPYEONG-DONG, GUMI-SI, GYEONGSANGBUK-DO, 730-360, KOREA, REPUBLIC OF
Covered Property (1)
Method for Measuring Particles in Glass Substrate
Patent: 6,972,422 →
Application: 10/816,818 →
Publication: US 2005/0116150
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Aug 6, 2010
From: SAMSUNG CORNING PRECISION GLASS CO., LTD.
To: SAMSUNG CORNING PRECISION MATERIALS CO., LTD.
Reel/Frame 024804/0238 →
Change of Name Jun 20, 2014
From: SAMSUNG CORNING PRECISION MATERIALS CO., LTD.
To: CORNING PRECISION MATERIALS CO., LTD.
Reel/Frame 033205/0584 →