Patent Assignment
Reel/Frame 015349/0040
Assignment of Assignor's Interest
Recorded: 2004-05-18
Pages: 3
Assignors
CHO, WON-IL
Executed: 2004-04-24
SHIN, IN-KYUN
Executed: 2004-04-24
PARK, JIN-HYUNG
Executed: 2004-04-24
Assignee
SAMSUNG ELECTRONICS CO., LTD.
416, MAETAN-DONG, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF
Covered Property
(1)
Reference Pattern for Creating a Defect Recognition Level, Method of Fabricating the Same and Method of Inspecting Defects Using the Same