IP Library Assignment 015488/0003
Patent Assignment
Reel/Frame 015488/0003

Assignment of Assignor's Interest

Recorded: 2004-06-22 Received: 2004-06-24 Pages: 2
Assignor
HARTMANN, UDO
Executed: 2002-03-02
Assignee
INFINEON TECHNOLOGIES AG
ST.-MARTIN-STRASSE 53, MUENCHEN, DEX, 81669, GERMANY
Covered Property (1)
Test System for Conducting a Function Test of a Semiconductor Element on a Wafer, and Operating Method
Application: 10/076,977 →