Patent Assignment
Reel/Frame 015488/0003
Assignment of Assignor's Interest
Recorded: 2004-06-22
Received: 2004-06-24
Pages: 2
Assignor
HARTMANN, UDO
Executed: 2002-03-02
Assignee
INFINEON TECHNOLOGIES AG
ST.-MARTIN-STRASSE 53, MUENCHEN, DEX, 81669, GERMANY
Covered Property
(1)
Test System for Conducting a Function Test of a Semiconductor Element on a Wafer, and Operating Method
Application:
10/076,977 →