IP Library › Assignment 015625/0237
Patent Assignment
Reel/Frame 015625/0237

Assignment of Assignor's Interest

Recorded: 2004-07-22 Pages: 3
Assignors
MATSUMOTO, MICHIKAZU
Executed: 2004-06-21
OKUNO, YASUTOSHI
Executed: 2004-06-21
JOUKYU, KATSUYOSHI
Executed: 2004-06-21
MATSUTANI, TETSUYA
Executed: 2004-06-21
Assignee
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
1006, OAZA KADOMA, KADOMA-SHI, OSAKA 571-8501, JAPAN
Covered Property (1)
Resistance Defect Assessment Device, Resistance Defect Assessment Method, and Method for Manufacturing Resistance Defect Assessment Device
Patent: 7,253,436 →
Application: 10/895,833 →
Publication: US 2005/0017746
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Sep 19, 2014
From: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
To: PANASONIC CORPORATION
Reel/Frame 033777/0873 →
Assignment of Assignor's Interest Jul 7, 2015
From: PANASONIC CORPORATION
To: PANNOVA SEMIC, LLC
Reel/Frame 036065/0273 →