Patent Assignment
Reel/Frame 015689/0007
Assignment of Assignor's Interest
Recorded: 2004-08-13
Pages: 3
Assignee
SUN MICROSYSTEMS, INC.
4150 NETWORK CIRCLE, SANTA CLARA, CALIFORNIA, 95054
Covered Property
(1)
Multi-Dimensional Sequential Probability Ratio Test for Detecting Failure Conditions in Computer Systems
Patent:
7,191,096 →
Application:
10/918,129 →
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.