Patent Assignment
Reel/Frame 015840/0132
Assignment of Assignor's Interest
Recorded: 2004-09-30
Pages: 2
Assignors
SHIBATA, YUKIHIRO
Executed: 2004-07-31
MAEDA, SHUNJI
Executed: 2004-07-31
KUBOTA, HITOSHI
Executed: 2004-07-31
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Method and Its Apparatus for Inspecting Defects